@inproceedings{NnAaaa,
	author="M. Terzi and C. Masiero and A. Beghi and M. Maggipinto and G.A. Susto",
	title="Deep Learning for Virtual Metrology: Modeling with Optical Emission Spectroscopy Data",
	booktitle="IEEE 3rd International Forum on Research and Technologies for Society and Industry (RTSI)",
	year="2017",
	organization="IEEE",
	location="Modena"
}