@inproceedings{susto2013efta,
	author="G.A. Susto and S. McLoone and A. Schirru and S. Pampuri and D. Pagano and A. Beghi",
	title="Prediction of Integral Type Failures in Semiconductor Manufacturing through Classification Methods",
	booktitle="18-th IEEE Conference on Emerging Technologies and Factory Automation",
	year="2013",
	month="September",
	location="Cagliari"
}